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Título : | Gypsum : an environment-friendly, inexpensive and robust height calibration standard at nanometer-scale for atomic force microscopy. |
Autor : | Barboza, Ana Paula Moreira Santos, Joyce Cristina da Cruz Pinto, Elisângela Silva Neves, Bernardo Ruegger Almeida |
Fecha de publicación : | 2019 |
Citación : | BARBOZA, A. P. M. et al. Gypsum: an environment-friendly, inexpensive and robust height calibration standard at nanometer-scale for atomic force microscopy. Nanotechnology, v. 30, dez. 2019. Disponível em: <https://iopscience.iop.org/article/10.1088/1361-6528/ab5ded>. Acesso em: 03 jul. 2020. |
Resumen : | Gypsum is an Earth-abundant mineral with enormous applications in agriculture and civil engineering. Here, we show it is also an excellent height calibration standard alternative for atomic force microscopy (AFM). Using plain water as etchant, gypsum flakes readily review 0.75 nm tall terraces which are easy to image (lateral dimensions from tens to hundreds of nanometers) and robust against time in ambient conditions. Therefore, the present work demonstrates a new height standard alternative which is easily-available for all AFM microscopists around the world. |
URI : | http://www.repositorio.ufop.br/handle/123456789/12586 |
metadata.dc.identifier.uri2: | https://iopscience.iop.org/article/10.1088/1361-6528/ab5ded |
metadata.dc.identifier.doi: | https://doi.org/10.1088/1361-6528/ab5ded |
ISSN : | 1361-6528 |
Aparece en las colecciones: | DEFIS - Artigos publicados em periódicos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
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ARTIGO_GypsumEnvironmentFriendly.pdf Restricted Access | 1,03 MB | Adobe PDF | Visualizar/Abrir |
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