Santos, L. F.Bianchi, Rodrigo FernandoFaria, Roberto MendonçaMergulhão, Sergio2015-03-122015-03-122006SANTOS, L. F. et al. Photogenerated carrier profile determination in polymeric light-emitting diodes by steady-state and transient photocurrent measurements. Materials Science and Engineering. B, Solid State Materials for Advanced Technology, v. 135, p. 103-107, 2006. Disponível em: <http://www.sciencedirect.com/science/article/pii/S0921510706005071>. Acesso em: 23 fev. 2015.0921-5107http://www.repositorio.ufop.br/handle/123456789/4616Photogenerated charge carrier profiles in poly(2-methoxy-5-(2_-ethyl-hexyloxy)-1,4-phenylene vinylene) (MEH-PPV) light-emitting diodes were determined from steady-state photocurrent spectra and transient photocurrent decay measurements. The observation that the photocurrent spectra behavior is strongly dependent on the bias polarity and amplitude suggests the existence of an intrinsic electric field, determined by the difference in the work function of the metallic electrodes, as well as a field dependence on the free charge carrier generation rates. The obtained results reveal built-in voltages of +0.2 and −0.6V for Au and Al electrodes, respectively. The photocurrent spectra can be semi-quantitatively explained using a simple model which takes into account the internal built-in electric field of the device structure, the band gap energy and the migration/diffusion of the photogenerated charge carriers through the polymeric film. The drift mobility of carriers was investigated by the time-of-flight technique (TOF). The value for the mobility of holes was obtained from the change of slopes in the double logarithmic plot of the transient current and was independent of the applied field. The TOF transients for electrons showed no change of slopes in the double logarithmic plot and the drift mobility of electrons could not be calculated.en-USPolymersPhotoconductionMobilityPhotogenerated carrier profile determination in polymeric light-emitting diodes by steady-state and transient photocurrent measurements.Artigo publicado em periodicoO periódico Materials Science and Engineering. B concede permissão para depósito do artigo no Repositório Institucional da UFOP. Número da licença: 3565381080838.https://doi.org/10.1016/j.mseb.2006.08.043